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Posted: 2025-04-21 18:11:56 UTC
This article contains some claims that remain unverified. While much of the content may be accurate, exercise care when relying on this information.
This article contains some claims that remain unverified. While much of the content may be accurate, exercise care when relying on this information.
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Last Updated
2025-04-21 18:12:08 UTC
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Rollup News
A study on the role of sample thickness and self-absorption effects in simultaneous XEOL-XAS measurements on single crystalline ZnO and GaN.
Sample thickness effects
Self-absorption effects
XEOL-XAS measurements
Single crystalline ZnO
Single crystalline GaN
Understanding the impact of sample thickness on XEOL-XAS measurements
Accounting for self-absorption effects in the analysis